C‑AFM

極めて伝導率の高い２層グラフェンシートの電流マッピングおよび伝導率定量評価

２層グラフェンシートの導電性分布可視化と極めて高い導電率を定量的に測定できた例です。

Fig. 1 Experimental setup of C-AFM measurements for Graphene

Experimental setup of C-AFM measurements for Graphene
Fig. 1. Schematic circuit of C-AFM measurement for graphene bi-layer stripe

Fig. 2 Quantitative resistivity measurement of exfoliated two-layer graphene on SiO2/Si substrate

Quantitative resistivity measurement of exfoliated two-layer graphene on SiO2/Si substrate
Fig. 2. Current mapping image of the bi-layer graphne stripe
Depth profile along the red dotted line of Fig. 2
Fig. 3. Depth profile along the red dotted line of Fig. 2. Distance dependence was obtained by a single probe
Agreement was obtained with macroscopic results
CAFMでGrapheneの極めて高い伝導率を測定できた
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